PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The alert did not successfully save. Please try again later.
Yi Jiang, Junjing Deng, Jeff A. Klug, Zhonghou Cai, Barry Lai, "Automatic parameter optimization for high-resolution ptychography," Proc. SPIE PC12698, X-Ray Nanoimaging: Instruments and Methods VI, PC1269807 (6 October 2023); https://doi.org/10.1117/12.2682128