Holographic Testing Of Aspherical Surfaces

R. Mercier

doi:10.1117/12.956160

18 April 1978 Holographic Testing Of Aspherical Surfaces

R. Mercier

Author Affiliations +

Proceedings Volume 0136, 1st European Conf on Optics Applied to Metrology; (1978) https://doi.org/10.1117/12.956160
Event: First European Conference on Optics Applied to Metrology, 1977, Strasbourg, France

Abstract

The use of a hologram in an interferometer in order to test an aspherical surface poses the problem of the choice between holograms with the carrier on the axis and holograms with inclined carrier. We compare the performances which we can expect from these two types of holograms in the case of an aspherical deformation of the 4th degree.

Citation Download Citation

R. Mercier "Holographic Testing Of Aspherical Surfaces", Proc. SPIE 0136, 1st European Conf on Optics Applied to Metrology, (18 April 1978); https://doi.org/10.1117/12.956160

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