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The general design features of a new low-background infrared sensor test facility which is being installed at Lockheed Missiles & Space Company, Inc. are described. A brief description of the following is given: the facility layout, clean room facility, vacuum chamber, cryo shroud, cryo/vacuum system, optical system, optical control system, infrared sources, and sensors, overall system control and instrumentation.
J. R. Grammer andP. B. Forney
"Lockheed Sensor Test Facility", Proc. SPIE 0256, Infrared Systems, (23 December 1980); https://doi.org/10.1117/12.959595
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