Spectral Characterization Methodology Of Thin-Film Optical Filters

Thomas W. Merritt; John V. Gavin; Charles A. Burke

doi:10.1117/12.932773

4 March 1982 Spectral Characterization Methodology Of Thin-Film Optical Filters

Thomas W. Merritt, John V. Gavin, Charles A. Burke

Author Affiliations +

Proceedings Volume 0308, Contemporary Infrared Standards and Calibration; (1982) https://doi.org/10.1117/12.932773
Event: 25th Annual Technical Symposium, 1981, San Diego, United States

Abstract

A review is presented of some of the more common pitfalls encountered in measuring and using thin-film interference filters. Measurement difficulties, including angle-of-incidence effects and the influence of instrument polarization and cone-angle, are described as well as problems such as the "Stierwalt Effect" which create difficulties in usage. The presence of imaginary "leaks" which appear in measurements and true "leaks" which do not show up in spectrophotometer scans (but do appear in your application) is discussed. The authors suggest measurement procedures and application techniques intended to circumvent these problems where possible.

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Thomas W. Merritt, John V. Gavin, and Charles A. Burke "Spectral Characterization Methodology Of Thin-Film Optical Filters", Proc. SPIE 0308, Contemporary Infrared Standards and Calibration, (4 March 1982); https://doi.org/10.1117/12.932773

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