A Frequency Domain Description Of Interferogram Analysis

Kenneth H. Womack

doi:10.1117/12.936356

15 November 1983 A Frequency Domain Description Of Interferogram Analysis

Kenneth H. Womack

Proceedings Volume 0429, Precision Surface Metrology; (1983) https://doi.org/10.1117/12.936356
Event: 27th Annual Technical Symposium, 1983, San Diego, United States

Abstract

Interferogram analysis is discussed as a sampling problem using the concepts of Fourier analysis. The relative merits of random, raster, and uniform sampling of a wavefront are examined. A relationship between a global least squares fit and interpolation in the spatial domain and transfer functions in the frequency domain is described.

Citation Download Citation

Kenneth H. Womack "A Frequency Domain Description Of Interferogram Analysis", Proc. SPIE 0429, Precision Surface Metrology, (15 November 1983); https://doi.org/10.1117/12.936356

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