A Heterodyne Interferometer For Testing Laser Diodes

John Hayes; Steve Lange

doi:10.1117/12.936336

15 November 1983 A Heterodyne Interferometer For Testing Laser Diodes

John Hayes, Steve Lange

Proceedings Volume 0429, Precision Surface Metrology; (1983) https://doi.org/10.1117/12.936336
Event: 27th Annual Technical Symposium, 1983, San Diego, United States

Abstract

A heterodyne, Mach-Zehnder interferometer system has been developed for testing the wavefront quality of laser diode collimator pens. The testing system is described and the problems associated with testing laser diodes are discussed.

Citation Download Citation

John Hayes and Steve Lange "A Heterodyne Interferometer For Testing Laser Diodes", Proc. SPIE 0429, Precision Surface Metrology, (15 November 1983); https://doi.org/10.1117/12.936336

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