An Expedient Approach To Focal Plane Testing

R. A. Chandos; P. A. Howes; J. J. Knight; W. J. Parrish

doi:10.1117/12.944662

8 November 1984 An Expedient Approach To Focal Plane Testing

R. A. Chandos, P. A. Howes, J. J. Knight, W. J. Parrish

Proceedings Volume 0501, State-of-the-Art Imaging Arrays and Their Applications; (1984) https://doi.org/10.1117/12.944662
Event: 28th Annual Technical Symposium, 1984, San Diego, United States

Abstract

A low cost focal plane array test set was developed using a small micro-computer system controller. By careful selection of test types, hardware/software programability trade-offs and good software design the set performance has compared well to much larger test systems. An additional benefit of small size was noted--system noise levels were very low, enabling acquisition of high quality low level signal and noise data.

Citation Download Citation

R. A. Chandos, P. A. Howes, J. J. Knight, and W. J. Parrish "An Expedient Approach To Focal Plane Testing", Proc. SPIE 0501, State-of-the-Art Imaging Arrays and Their Applications, (8 November 1984); https://doi.org/10.1117/12.944662

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