Devices For Measuring MTFs In The Infrared

Kenneth Pulliam; Stephen McHugh

doi:10.1117/12.944999

21 January 1985 Devices For Measuring MTFs In The Infrared

Kenneth Pulliam, Stephen McHugh

Proceedings Volume 0510, Infrared Technology X; (1985) https://doi.org/10.1117/12.944999
Event: 28th Annual Technical Symposium, 1984, San Diego, United States

Abstract

MTFs are usually computed indirectly from spread functions. The patterns used to generate these functions lead to certain problems in infrared systems. Square wave patterns have some advantages but also have some disadvantages. Sine wave patterns are useful but generally must be produced as area patterns. Various ways of using sinusoidal patterns are described.

Citation Download Citation

Kenneth Pulliam and Stephen McHugh "Devices For Measuring MTFs In The Infrared", Proc. SPIE 0510, Infrared Technology X, (21 January 1985); https://doi.org/10.1117/12.944999

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available