Paper
16 July 1986 A Novel Method For Evaluating The Resolution And The Wavefront Of Plane Diffraction Grating With FFT
Zhong Lin, Wen-Hong Chin
Author Affiliations +
Proceedings Volume 0599, Optics in Engineering Measurement; (1986) https://doi.org/10.1117/12.952390
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France
Abstract
This paper presents a novel method for evaluating the resolution and the wavefront of a plane diffraction grating. Essentially, it is an application of Fourier transformation to the grating. The results of experiments and computation are present, too. They are in good agreement with the results obtained by the method commonly used.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhong Lin and Wen-Hong Chin "A Novel Method For Evaluating The Resolution And The Wavefront Of Plane Diffraction Grating With FFT", Proc. SPIE 0599, Optics in Engineering Measurement, (16 July 1986); https://doi.org/10.1117/12.952390
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KEYWORDS
Diffraction gratings

Wavefronts

Diffraction

Interferometers

Spectral resolution

Optical testing

Fourier transforms

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