Single Figure Merit Function For AR-Coatings In Electro-Optical Systems

Konrad A Roider; Peter Ganner

doi:10.1117/12.938428

31 October 1986 Single Figure Merit Function For AR-Coatings In Electro-Optical Systems

Konrad A Roider, Peter Ganner

Proceedings Volume 0655, Optical System Design, Analysis, Production for Advanced Technology Systems; (1986) https://doi.org/10.1117/12.938428
Event: 1986 International Symposium/Innsbruck, 1986, Innsbruck, Austria

Abstract

Merit functions are derived for non-imaging and imaging systems. In non-imaging (energy-collecting) systems it is essential to maximize the output signal of the detector, which leads to the well established criterion of maximizing system throughput. Imaging systems, on the other hand, require maximizing the spatial signal-to-background ratio. The merit function derived from this criterion is suitable for assessing different coating designs relating to their effectiveness in electro-optical systems.

Citation Download Citation

Konrad A Roider and Peter Ganner "Single Figure Merit Function For AR-Coatings In Electro-Optical Systems", Proc. SPIE 0655, Optical System Design, Analysis, Production for Advanced Technology Systems, (31 October 1986); https://doi.org/10.1117/12.938428

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available