Effects Of Surface And Bulk Defects In Transmitting Materials On Optical Resolution And Scattered Light

H. E. Bennett; D. W. Ricks

doi:10.1117/12.936431

19 December 1986 Effects Of Surface And Bulk Defects In Transmitting Materials On Optical Resolution And Scattered Light

H. E. Bennett, D. W. Ricks

Author Affiliations +

Proceedings Volume 0683, Infrared and Optical Transmitting Materials; (1986) https://doi.org/10.1117/12.936431
Event: 30th Annual Technical Symposium, 1986, San Diego, United States

Abstract

The origin of scattered light, particularly near-angle scattered light, and its effect on optical resolution have been analyzed. Also, an instrument is described that can measure near-angle scatter. An application of Rayleigh and Mie scattering theories shows that a few large defects cause a high level of near-angle scatter, which leads to a loss of resolution. The degradation in resolution is severe when trying to resolve a bright object near a faint object. A relatively simple apparatus has been built that can measure near-angle scatter at angles as small as 0.03 degrees and at levels of 10-6 peak intensity.

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H. E. Bennett and D. W. Ricks "Effects Of Surface And Bulk Defects In Transmitting Materials On Optical Resolution And Scattered Light", Proc. SPIE 0683, Infrared and Optical Transmitting Materials, (19 December 1986); https://doi.org/10.1117/12.936431

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