Thermal Wave Imaging

Richard M. Miller

doi:10.1117/12.936491

10 December 1986 Thermal Wave Imaging

Richard M. Miller

Proceedings Volume 0685, Infrared Technology XII; (1986) https://doi.org/10.1117/12.936491
Event: 30th Annual Technical Symposium, 1986, San Diego, United States

Abstract

Thermal wave imaging is a non-destructive testing technique which uses optically induced heat fluxes to probe the physical and chemical properties of solid samples. Localised heat sources are generated by the absorption of light from a focussed laser beam, and the propagation of heat from these sources is modified by the local thermal properties of the sample, providing a contrast mechanism. The technique can be applied to transparent, translucent and opaque materials. Information can be obtained about the thickness of coatings, the integrity of coating substrate interfaces, the presence of microscopic defects and inclusions, and the thermal characteristics of the material. Information can be obtained with a resolution of a few microns in both the X-Y plane, and along the Z-axis into the sample.

Citation Download Citation

Richard M. Miller "Thermal Wave Imaging", Proc. SPIE 0685, Infrared Technology XII, (10 December 1986); https://doi.org/10.1117/12.936491

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