Some Considerations On Glitches And The Design Of A Double Crystal Monochromator With Bent Crystals

P. van Zuylen; M. J. van der Hoek

doi:10.1117/12.964917

1 January 1986 Some Considerations On Glitches And The Design Of A Double Crystal Monochromator With Bent Crystals

P. van Zuylen, M. J. van der Hoek

Proceedings Volume 0733, Soft X-Ray Optics and Technology; (1986) https://doi.org/10.1117/12.964917
Event: Soft X-Ray Optics and Technology, 1987, Berlin, Germany

Abstract

Unwanted reflections, which are due to the structure of the crystal, cause glitches in the X-ray transmission of high resolution crystal monochromators. The wavelength at which the glitches appear depends on the orientation of the crystal. We show that by a slight rotation of the crystal in the plane facing the X-ray beam it is possible to cover a large energy range (5 to 14 keV) for EXAFS or XANES experiments with one set of crystals. The implementation in practice will be discussed.

Citation Download Citation

P. van Zuylen and M. J. van der Hoek "Some Considerations On Glitches And The Design Of A Double Crystal Monochromator With Bent Crystals", Proc. SPIE 0733, Soft X-Ray Optics and Technology, (1 January 1986); https://doi.org/10.1117/12.964917

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available