Studies of interfacial structure in WC multilayers

Ashley Fuller; Roman Tatchyn; Paul Csonka; Ingolf Lindau

doi:10.1117/12.964923

1 January 1986 Studies of interfacial structure in WC multilayers

Ashley Fuller, Roman Tatchyn, Paul Csonka, Ingolf Lindau

Proceedings Volume 0733, Soft X-Ray Optics and Technology; (1986) https://doi.org/10.1117/12.964923
Event: Soft X-Ray Optics and Technology, 1987, Berlin, Germany

Abstract

This paper reports on a set of interfacial structure studies in WC multilayers. Statistical investigations were conducted to ascertain whether building up layers containing, on the average, an integer number of atoms could in any way minimize the effects of interfacial roughness.

Citation Download Citation

Ashley Fuller, Roman Tatchyn, Paul Csonka, and Ingolf Lindau "Studies of interfacial structure in WC multilayers", Proc. SPIE 0733, Soft X-Ray Optics and Technology, (1 January 1986); https://doi.org/10.1117/12.964923

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