Infrared Diffuse Reflectometer For Spectral, Angular And Temperature Resolved Measurements

Leonard M. Hanssen; Keith A. Snail

doi:10.1117/12.941451

10 September 1987 Infrared Diffuse Reflectometer For Spectral, Angular And Temperature Resolved Measurements

Leonard M. Hanssen, Keith A. Snail

Proceedings Volume 0807, Passive Infrared Systems and Technology; (1987) https://doi.org/10.1117/12.941451
Event: Fourth International Symposium on Optical and Optoelectronic Applied Sciences and Engineering, 1987, The Hague, Netherlands

Abstract

This paper describes an integrating sphere - Fourier Transform Spectrophotometer (FTS) instrument and its measurements of directional hemispherical reflectance as a function of angle, temperature and wavelength in the infrared. Samples can be mounted in the center of the sphere or on the wall of the sphere. The center mounted samples can be tilted to vary the beam incidence angle from 0° to 60°; wall mounted samples can be heated to temperatures of 250°C. Measurements on samples using both sample mounts are presented and compared. A discussion of the measurement techniques used to obtain round robin results (presented in an accompanying paper) is also given. A study of the temperature dependence of a single round robin sample is presented. Detailed measurements of a ruled gold sample are given and the importance of the detector's field-of-view in explaining this data is demonstrated with a simple experiment.

Citation Download Citation

Leonard M. Hanssen and Keith A. Snail "Infrared Diffuse Reflectometer For Spectral, Angular And Temperature Resolved Measurements", Proc. SPIE 0807, Passive Infrared Systems and Technology, (10 September 1987); https://doi.org/10.1117/12.941451

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