Infrared Measurements With HgCdTe Detector Applied To Non Destructive Control And Thermal Characterization Of Materials

Jean-Michel A. Roux

doi:10.1117/12.941836

10 November 1987 Infrared Measurements With HgCdTe Detector Applied To Non Destructive Control And Thermal Characterization Of Materials

Jean-Michel A. Roux

Author Affiliations +

Proceedings Volume 0819, Infrared Technology XIII; (1987) https://doi.org/10.1117/12.941836
Event: 31st Annual Technical Symposium on Optical and Optoelectronic Applied Sciences and Engineering, 1987, San Diego, CA, United States

Abstract

An experimental set-up has been built to determine thermophysical constants of samples of various materials at room temperature. The same experimental equipment is used to evaluate the joint resistance of a two- layer sample. Theorical calculations are in good agreement with experimental results.Under certain circumstances, thermal losses and flash lamp efficiency can be taken into account.

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Jean-Michel A. Roux "Infrared Measurements With HgCdTe Detector Applied To Non Destructive Control And Thermal Characterization Of Materials", Proc. SPIE 0819, Infrared Technology XIII, (10 November 1987); https://doi.org/10.1117/12.941836

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