Computer-Aided In-Plane-Displacement And-Strain Measurement By Means Of Holographic Interferometry

W. Schwab; J. Gutjahr; A. Ettemeyer; H. Kockelmann

doi:10.1117/12.943499

1 June 1988 Computer-Aided In-Plane-Displacement And-Strain Measurement By Means Of Holographic Interferometry

W. Schwab, J. Gutjahr, A. Ettemeyer, H. Kockelmann

Proceedings Volume 0863, Industrial Optoelectronic Measurement Systems Using Coherent Light; (1988) https://doi.org/10.1117/12.943499
Event: 1987 Symposium on the Technologies for Optoelectronics, 1987, Cannes, France

Abstract

A holographic arrangement using two holograms symmetrically placed to the perpendicular of the component under investigation will be introduced. By means of a simple difference method using an image processing system, the relative in-plane-displacement and corresponding strain in a defined direction can be determined. The effects of other directional movements (e.g. tilting) will be fully compensated.

Citation Download Citation

W. Schwab, J. Gutjahr, A. Ettemeyer, and H. Kockelmann "Computer-Aided In-Plane-Displacement And-Strain Measurement By Means Of Holographic Interferometry", Proc. SPIE 0863, Industrial Optoelectronic Measurement Systems Using Coherent Light, (1 June 1988); https://doi.org/10.1117/12.943499

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available