Fast Detection Of Residual Stresses By Shearography

M. Y. Y. Hung; K. W. Long; X. Zhang; J. D . Hovanesian; R. Hathaway

doi:10.1117/12.947662

14 December 1988 Fast Detection Of Residual Stresses By Shearography

M. Y. Y. Hung, K. W. Long, X. Zhang, J. D . Hovanesian, R. Hathaway

Proceedings Volume 0955, Industrial Laser Interferometry II; (1988) https://doi.org/10.1117/12.947662
Event: SPIE International Symposium on Optical Engineering and Industrial Sensing for Advance Manufacturing Technologies, 1988, Dearborn, MI, United States

Abstract

A modified shearographic (speckle-shearing) method for the rapid detection of residual stress in elastic engineering materials and components has been introduced. A coherent monochromatic light source (laser) is required to enable interference fringes to appear in the recording medium as a result of path length changes occurring between the two separate exposures during the evaluation. The path length change is a function of the objects surface displacement. The method employs a special image-shearing camera permitting quasi-full field measurement of surface displacement. A surface displacement, which occurs due to altering the specimen surface in the test area between the two exposures of a double exposure method, produces a fringe pattern which is visible using a high-pass Fourier filtering device. The viewed fringe pattern is directly related to stresses that are changed due to the surface alteration. The stresses altered are those present due to either a live-load or those resident in the specimen.

Citation Download Citation

M. Y. Y. Hung, K. W. Long, X. Zhang, J. D . Hovanesian, and R. Hathaway "Fast Detection Of Residual Stresses By Shearography", Proc. SPIE 0955, Industrial Laser Interferometry II, (14 December 1988); https://doi.org/10.1117/12.947662

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