Application of linear CCD in tunnel crack detection

Jie Liu; Hua Li; Xin Jiang; Hemin Chang

doi:10.1117/12.2257653

28 February 2017 Application of linear CCD in tunnel crack detection

Jie Liu, Hua Li, Xin Jiang, Hemin Chang

Proceedings Volume 10256, Second International Conference on Photonics and Optical Engineering; 102562Y (2017) https://doi.org/10.1117/12.2257653
Event: Second International Conference on Photonics and Optical Engineering, 2016, Xi'an, China

Abstract

To meet the actual demand, the linear CCD technology is applied to tunnel crack detection, and an edge detection algorithm is proposed to measure the crack width. Firstly, the application form of linear CCD imaging technology in tunnel crack detection is introduced concretely in this paper. Then, the key influencing parameters of measurement are discussed. Finally, an edge detection algorithm based on the change of gray level in linear direction is proposed and it is verified by experiments. Experimental results indicated that the linear CCD imaging technology in tunnel crack detection could obtain measurement data quickly and improve the efficiency of tunnel cracks’ measurement, and that the detection algorithm could be used for the crack width measuring.

Citation Download Citation

Jie Liu, Hua Li, Xin Jiang, and Hemin Chang "Application of linear CCD in tunnel crack detection", Proc. SPIE 10256, Second International Conference on Photonics and Optical Engineering, 102562Y (28 February 2017); https://doi.org/10.1117/12.2257653

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