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10 April 2018 Rapid bacterial identification based on surface-enhanced Raman scattering and machine learning (Conference Presentation) (Withdrawal Notice)
Chi-Sing Ho, Neal Jean, Amr Saleh, Stefano Ermon, Niaz Banaei, Jennifer A. Dionne
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Proceedings Volume 10479, Light-Based Diagnosis and Treatment of Infectious Diseases; 1047904 (2018) https://doi.org/10.1117/12.2291601
Event: SPIE BiOS, 2018, San Francisco, California, United States
Abstract
Publisher’s Note: This conference presentation, originally published on 14 March 2018, was withdrawn per author request on 10 April 2018.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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Chi-Sing Ho, Neal Jean, Amr Saleh, Stefano Ermon, Niaz Banaei, and Jennifer A. Dionne "Rapid bacterial identification based on surface-enhanced Raman scattering and machine learning (Conference Presentation) (Withdrawal Notice)", Proc. SPIE 10479, Light-Based Diagnosis and Treatment of Infectious Diseases, 1047904 (10 April 2018); https://doi.org/10.1117/12.2291601
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KEYWORDS
Machine learning
Raman scattering
Holmium
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