Surface Plasmons As Interfacial Light For The Characterization Of Thin Films

Wolfgang Knoll; Benno Rothenhausler; Werner Hickel

doi:10.1117/12.951615

15 August 1989 Surface Plasmons As Interfacial Light For The Characterization Of Thin Films

Wolfgang Knoll, Benno Rothenhausler, Werner Hickel

Proceedings Volume 1056, Photochemistry in Thin Films; (1989) https://doi.org/10.1117/12.951615
Event: OE/LASE '89, 1989, Los Angeles, CA, United States

Abstract

This paper deals with the application of plasmon surface polaritions (PSP) for the characterization of thin films, e.g. Langmuir-Blodgett multilayer assemblies. Examples are given for total internal diffraction of PSP by dielectric phase gratings, interferometry at an index step and, finally, recent developments in the new field of PSP imaging and microscopy are presented.

Citation Download Citation

Wolfgang Knoll, Benno Rothenhausler, and Werner Hickel "Surface Plasmons As Interfacial Light For The Characterization Of Thin Films", Proc. SPIE 1056, Photochemistry in Thin Films, (15 August 1989); https://doi.org/10.1117/12.951615

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