Paper
29 August 1977 The Curved Crystal X-Ray Spectrometer For The HEAO-B Satellite
C. R. Canizares, G. W. Clark, D. Bardas, T. Markert
Author Affiliations +
Proceedings Volume 0106, X-Ray Imaging; (1977) https://doi.org/10.1117/12.955467
Event: 1977 SPIE/SPSE Technical Symposium East, 1977, Reston, United States
Abstract
The Focal Plane Crystal Spectrometer on HEAO-B is a moderate to high resolution, curved-crystal, Bragg spectrometer which operates behind a grazing incidence x-ray telescope. It is designed to allow detailed spectral studies of both point and extended celestial x-ray sources in the energy range 0.2-3.3 keV, with resolutions of 50 to 1000. The analyzing elements are six torroidal diffractors, and the detectors are position-sensitive, flow, proportional counters. HEAO-B is scheduled for launch in June, 1978.
© (1977) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C. R. Canizares, G. W. Clark, D. Bardas, and T. Markert "The Curved Crystal X-Ray Spectrometer For The HEAO-B Satellite", Proc. SPIE 0106, X-Ray Imaging, (29 August 1977); https://doi.org/10.1117/12.955467
Lens.org Logo
CITATIONS
Cited by 9 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Crystals

Sensors

Spectroscopy

X-rays

Spectral resolution

X-ray telescopes

Telescopes

RELATED CONTENT

Development of a photon counting near fano limited x ray...
Proceedings of SPIE (December 13 2020)
The NeXT mission
Proceedings of SPIE (June 15 2006)
The high energy telescope on EXIST
Proceedings of SPIE (September 02 2009)
SODART telescopes on the Spectrum X Gamma (SRG) and their...
Proceedings of SPIE (November 11 1994)
EXIST: mission design concept and technology program
Proceedings of SPIE (March 11 2003)

Back to Top