Fringing solution for the mid-infrared instrument on-board the James Webb Space Telescope

Ioannis Argyriou; Bart Vandenbussche; Martyn Wells

doi:10.1117/12.2310268

6 July 2018 Fringing solution for the mid-infrared instrument on-board the James Webb Space Telescope

Ioannis Argyriou, Bart Vandenbussche, Martyn Wells

Proceedings Volume 10698, Space Telescopes and Instrumentation 2018: Optical, Infrared, and Millimeter Wave; 106983O (2018) https://doi.org/10.1117/12.2310268
Event: SPIE Astronomical Telescopes + Instrumentation, 2018, Austin, Texas, United States

Abstract

The Mid-Infrared Instrument (MIRI) on-board the James Webb Space Telescope (JWST) performs medium resolution spectroscopy in the 5 to 28.5micron wavelength range. The Medium-Resolution Spectrometer (MRS) of MIRI uses two Si:As impurity band conduction detector arrays. Coherent reflection of infrared light within the MIRI MRS detectors results in fringing; the detector layers act as efficient Fabry-Pérot etalons. In this paper we present three methods to calibrate out the fringes, as part of the MIRI data reduction pipeline. The methods are presented in the context of the investigations on the fringing seen in the MIRI flight model ground test data. The investigations show that the detector fringe transmission depends on the illumination pattern of the observed source on the detector. Optical stimuli of different spatial extents and position in the field-of-view yield different fringe patterns in their extracted spectra. An optical model of the MIRI detectors is hence proposed. By solving the Fresnel equations across the model optical layers, a source-specific fringe correction is derived.

Citation Download Citation

Ioannis Argyriou, Bart Vandenbussche, and Martyn Wells "Fringing solution for the mid-infrared instrument on-board the James Webb Space Telescope", Proc. SPIE 10698, Space Telescopes and Instrumentation 2018: Optical, Infrared, and Millimeter Wave, 106983O (6 July 2018); https://doi.org/10.1117/12.2310268

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KEYWORDS

Sensors

Fabry–Perot interferometers

Transmittance

Geometrical optics

Fringe analysis

Calibration

Silicon

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