Presentation + Paper
3 October 2018 Advancements in pellicle glue residue removal
Davide Dattilo, Sebastian Dietze, Martin Samayoa, Uwe Dietze, Victoria Dahl, Zhenxing Han
Author Affiliations +
Abstract
A pellicle is employed to protect a photomask from particle contamination. The pellicle is positioned at a distance from the photomask pattern such that particle contaminants are out of focus. To extend the lifetime of a photomask, the pellicle must be replaced when it becomes heavily contaminated or damaged. The replacement process generally consists of the following three steps, 1) removal of the existing pellicle, 2) cleaning of the photomask, and 3) installation of a new pellicle. The cleaning step is primarily required for the removal of pellicle-glue residue unintentionally left behind during the pellicle removal process. This cleaning step has traditionally employed aggressive chemistries, such as a long process cycle, utilizing a Sulfuric Acid and Hydrogen Peroxide mix (SPM). The major drawback from this approach is that it inadvertently exposes the photomask pattern to aggressive chemistries, risking CD shift, damage to sub-resolution assist features (SRAFs), and accelerated haze growth, thus, ultimately reducing a masks lifetime [1]. To overcome these shortcomings, this paper presents a localized approach for removal of pellicle-glue residue, which does not require long SPM cycles for post-clean.
Conference Presentation
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Davide Dattilo, Sebastian Dietze, Martin Samayoa, Uwe Dietze, Victoria Dahl, and Zhenxing Han "Advancements in pellicle glue residue removal", Proc. SPIE 10810, Photomask Technology 2018, 108100R (3 October 2018); https://doi.org/10.1117/12.2503937
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Pellicles

Inspection

Scanning probe microscopy

Photomasks

Optical inspection

Reticles

Chemistry

RELATED CONTENT

NXE pellicle offering a EUV pellicle solution to the...
Proceedings of SPIE (March 18 2016)
Photomask production integration of KLA STARlight 300 system
Proceedings of SPIE (December 08 1995)
Photomask cleaning for high-density and embedded PSM
Proceedings of SPIE (July 03 1995)
Status and path to a final EUVL reticle-handling solution
Proceedings of SPIE (March 15 2007)
Advanced pelliclization techniques
Proceedings of SPIE (December 07 1994)

Back to Top