Paper
15 March 2019 Swift heavy ion stimulated formation of the Si quantum dots in Si/SiO2 multilayer heterostructures
G. N. Kamaev, S. G. Cherkova, A. A. Gismatulin, V. A. Volodin, V. A. Skuratov
Author Affiliations +
Proceedings Volume 11022, International Conference on Micro- and Nano-Electronics 2018; 1102213 (2019) https://doi.org/10.1117/12.2522161
Event: The International Conference on Micro- and Nano-Electronics 2018, 2018, Zvenigorod, Russian Federation
Abstract
In the present study, we experimentally examined the effect of swift Хе ion irradiation of multilayer structures involving ultrathin alternating layers of SiO2 and amorphous hydrogenated silicon (α-Si:H), and subsequent isochronal anneals of such structures, on their properties. It is shown that the action of swift heavy ions on Si/SiO2 multilayer structures leads to the formation of Si nanoclusters. In the latter case, the multi-layer structure of the samples was retained, and the ordering of nanoclusters along ion tracks was observed. The irradiation produces nuclei which, during subsequent anneals, facilitate the formation of Si nanocrystals (Si NCs) in the dielectric layer. In the multi-layer metal-oxide-semiconductor (MOS) structures with Si NCs embedded in the dielectric matrix, a phenomenon of bipolar resistive switching was observed. On increasing the number of NC layers, during the on-off process intermediate metastable states were manifested. This observation may prove important for realization of intermediate resistance values (multi-bit data storage) and for the development of additive neuromorphic systems.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
G. N. Kamaev, S. G. Cherkova, A. A. Gismatulin, V. A. Volodin, and V. A. Skuratov "Swift heavy ion stimulated formation of the Si quantum dots in Si/SiO2 multilayer heterostructures", Proc. SPIE 11022, International Conference on Micro- and Nano-Electronics 2018, 1102213 (15 March 2019); https://doi.org/10.1117/12.2522161
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Silicon

Ions

Raman spectroscopy

Annealing

Crystals

Dielectrics

Heterojunctions

Back to Top