Nanofocus characterization at the Coherent X-ray Imaging instrument using 2D single grating interferometry

Matthew H. Seaberg; Andrew Aquila; Mengning Liang; Hae Ja Lee; Bob Nagler; Yanwei Liu; Anne Sakdinawat; Frank Seiboth; Mikako Makita; Yanwen Sun; Riccardo Signorato; Sergio Carbajo; Yiping Feng; Jacek Krzywinski; Diling Zhu; Sébastien Boutet

doi:10.1117/12.2526647

24 April 2019 Nanofocus characterization at the Coherent X-ray Imaging instrument using 2D single grating interferometry

Matthew H. Seaberg, Andrew Aquila, Mengning Liang, Hae Ja Lee, Bob Nagler, Yanwei Liu, Anne Sakdinawat, Frank Seiboth, Mikako Makita, Yanwen Sun, Riccardo Signorato, Sergio Carbajo, Yiping Feng, Jacek Krzywinski, Diling Zhu, Sébastien Boutet

Author Affiliations +

Proceedings Volume 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V; 110380L (2019) https://doi.org/10.1117/12.2526647
Event: SPIE Optics + Optoelectronics, 2019, Prague, Czech Republic

Abstract

In this work we present the application of a 2D single grating wavefront sensor to align and characterize the 100 nm focus at the Coherent X-ray Imaging (CXI) endstation at the Linac Coherent Light Source (LCLS). The results agree well with a model of the system, indicating that the mirrors perform as designed when alignment is optimized. In addition, a comparison with the imprint technique confirms the validity of the results, which showed that wavefront-based alignment resulted in negligible astigmatism. Analysis of the retrieved focus profile indicates that intensities <10²¹ W=cm² are achievable with currently available LCLS beam parameters and optimal mirror alignment.

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Matthew H. Seaberg, Andrew Aquila, Mengning Liang, Hae Ja Lee, Bob Nagler, Yanwei Liu, Anne Sakdinawat, Frank Seiboth, Mikako Makita, Yanwen Sun, Riccardo Signorato, Sergio Carbajo, Yiping Feng, Jacek Krzywinski, Diling Zhu, and Sébastien Boutet "Nanofocus characterization at the Coherent X-ray Imaging instrument using 2D single grating interferometry", Proc. SPIE 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V, 110380L (24 April 2019); https://doi.org/10.1117/12.2526647

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