PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
Recently, the metal oxide nanoclusters (or nanoparticles) have attracted much attention as a promising candidate for a resist material used for the high-volume manufacturing of semiconductor devices. The radiation-induced reactions of ligands play an important role in the sensitization of metal oxide nanocluster resists. In this study, the radiation-induced reactions of carboxylic acid ligands were investigated using a pulse radiolysis method. The results obtained in this study indicated that the molecular structures of ligands affect their reactivity to cationic and anion species and the stability of their radical cations and anions.
Takahiro Kozawa andYusa Muroya
"EUV sensitization mechanisms of carboxylic acids used as ligands of metal oxide nanocluster resists (Conference Presentation)", Proc. SPIE 11323, Extreme Ultraviolet (EUV) Lithography XI, 113231B (24 March 2020); https://doi.org/10.1117/12.2554989
ACCESS THE FULL ARTICLE
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The alert did not successfully save. Please try again later.
Takahiro Kozawa, Yusa Muroya, "EUV sensitization mechanisms of carboxylic acids used as ligands of metal oxide nanocluster resists (Conference Presentation)," Proc. SPIE 11323, Extreme Ultraviolet (EUV) Lithography XI, 113231B (24 March 2020); https://doi.org/10.1117/12.2554989