Paper
18 December 2019 The influence of CCD undersampling on the encircled energy of SVOM-VT
Author Affiliations +
Proceedings Volume 11341, AOPC 2019: Space Optics, Telescopes, and Instrumentation; 1134104 (2019) https://doi.org/10.1117/12.2539072
Event: Applied Optics and Photonics China (AOPC2019), 2019, Beijing, China
Abstract
SVOM-VT has entered the initial phase development stage, and encircled energy is its key performance index. In the development process, it is necessary to determine the encircled energy of the optical lens stage and the system stage. The image recording of a CCD detector includes two imaging processes: one is the pixel integration imaging process, in which the output signal of each pixel is proportional to the area integration of the incident light intensity on the surface of the pixel; the other is the discrete sampling process, in which the continuous graphical object is sampled discretely at the sampling interval of the center distance of the pixel. Based on the data of SVOM-VT, the effect of CCD under-sampling on the encircled energy of detection camera is characterized by simulation and test. Imaging process of CCD pairs of scattered speckles from the lens is a two-dimensional discrete sampling process, as well as the sampling process of discrete signals. This process will lead to low-frequency noise (under-sampling noise) in the sampling of high-frequency signals by CCD detectors, resulting in spectrum aliasing (low-frequency signal distortion) of image signals. Intuitively, the original image is broadened. When the sampling density is increased, this will not be the case.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xun Xue, Chunmin Zhang, Jianke Zhao, Yan Zhou, Shangkuo Liu, Kewei E., Kun Li, Zhengfeng Wang, and Jing Li "The influence of CCD undersampling on the encircled energy of SVOM-VT", Proc. SPIE 11341, AOPC 2019: Space Optics, Telescopes, and Instrumentation, 1134104 (18 December 2019); https://doi.org/10.1117/12.2539072
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Charge-coupled devices

Image processing

Signal processing

CCD image sensors

Signal detection

Sensors

Integral imaging

Back to Top