Paper
1 December 1989 Applications Of Step-Scan Interferometry
Christopher J. Manning, Jeffrey M. Widder, Richard A. Palmer, James L. Chao
Author Affiliations +
Proceedings Volume 1145, 7th Intl Conf on Fourier Transform Spectroscopy; (1989) https://doi.org/10.1117/12.969609
Event: Seventh International Conference on Fourier and Computerized Infrared Spectroscopy, 1989, Fairfax, VA, United States
Abstract
Interferometry, in combination with the Fourier transform, is a powerful tool for IR spectroscopy. However, most commercial MIR spectrometers are not well suited to measuring spectra of dynamic systems. This disadvantage is due to the rapid scan mode of operation, in which the scanning mirror of the interferometer moves at constant velocity, v. As a consequence, each IR wavelength, λ, is modulated with its own Fourier frequency (f = 2v/λ). This time dependent modulation of the IR, caused by the rapid scan, becomes increasingly more difficult to separate from time dependent variations of the IR intensity caused by a dynamic system under study, as the time resolution desired approaches the Fourier modulation periods. A convenient solution to this problem is the use of step-scan interferometry. In this mode of operation, the moving mirror of the interferometer is stopped at evenly spaced intervals of the HeNe reference laser interference pattern while data are collected. As a consequence, the IR light is not modulated by the interferometer, and temporal intensity variations can be related to the dynamic system under study. Applications include photothermal/photoacoustic spectroscopy, phase-resolved spectroscopy, and classic time-resolved spectroscopy (i.e., pulsed excitation).
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Christopher J. Manning, Jeffrey M. Widder, Richard A. Palmer, and James L. Chao "Applications Of Step-Scan Interferometry", Proc. SPIE 1145, 7th Intl Conf on Fourier Transform Spectroscopy, (1 December 1989); https://doi.org/10.1117/12.969609
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Cited by 4 scholarly publications.
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KEYWORDS
Modulation

Phase shift keying

Spectroscopy

Interferometry

Time resolved spectroscopy

Adhesives

FT-IR spectroscopy

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