Paper
22 May 2020 Reflection and transmission of focused light beam at a dielectric interface
Author Affiliations +
Proceedings Volume 11516, Optical Technologies for Telecommunications 2019; 115160U (2020) https://doi.org/10.1117/12.2566490
Event: XVII International Scientific and Technical Conference "Optical Technologies for Telecommunications", 2019, Kazan, Russian Federation
Abstract
The reflection and transmission of TE and TM polarized extremely narrow wave beams which are oblique incident on the dielectric interface are analyzed. Disappearance of the Brewster angle and total internal reflection effects for the strongly focused beams is predicted. The change in beam profile after reflection and transmission for different polarizations, incident beam spots and incidence angles is analyzed. Experiments using NSOM (near-field scanning optical probe) fiber probe with an aperture diameter 50 nm are conducted. It is demonstrated that substantial output light intensity increase occurs at the probe end/glass plate interface.
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
N. I. Petrov "Reflection and transmission of focused light beam at a dielectric interface", Proc. SPIE 11516, Optical Technologies for Telecommunications 2019, 115160U (22 May 2020); https://doi.org/10.1117/12.2566490
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KEYWORDS
Interfaces

Dielectrics

Reflectivity

Transmittance

Wavefronts

Dielectric polarization

Diffraction

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