Non-Contact Picosecond Electro-Optic Sampling Utilizing Semiconductor Laser Pulses

S. Aoshima; H. Takahashi; T. Nakamura; Y. Tsuchiya

doi:10.1117/12.962455

17 January 1990 Non-Contact Picosecond Electro-Optic Sampling Utilizing Semiconductor Laser Pulses

S. Aoshima, H. Takahashi, T. Nakamura, Y. Tsuchiya

Proceedings Volume 1155, Ultrahigh Speed and High Speed Photography, Photonics, and Videography '89: Seventh in a Series; (1990) https://doi.org/10.1117/12.962455
Event: 33rd Annual Technical Symposium, 1989, San Diego, United States

Abstract

Non-contact picosecond electro-optic sampling utilizing semiconductor laser pulses, which is compact, easy to use and inexpensive, is described focusing on the recent improvements such as reduction of system noise, adoption of a longitudinal E-0 probe and its advantages, monitoring system of the measurement point, and improvement of the space dependent sensitivity. We demonstrate the equivalent input noise of 125mV/IHz with a temporal resolution of 45ps at a distance of 20gm between the probe tip and the device under test, with a 4.5s measuring time. We also discuss the possibility of absolute voltage measurement.

Citation Download Citation

S. Aoshima, H. Takahashi, T. Nakamura, and Y. Tsuchiya "Non-Contact Picosecond Electro-Optic Sampling Utilizing Semiconductor Laser Pulses", Proc. SPIE 1155, Ultrahigh Speed and High Speed Photography, Photonics, and Videography '89: Seventh in a Series, (17 January 1990); https://doi.org/10.1117/12.962455

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