Terahertz ghost imaging and surface plasmon resonance microscopy: analysis of factors affecting the image quality

Ildus Sh. Khasanov; Lidia A. Zykova

doi:10.1117/12.2580599

17 November 2020 Terahertz ghost imaging and surface plasmon resonance microscopy: analysis of factors affecting the image quality

Ildus Sh. Khasanov, Lidia A. Zykova

Author Affiliations +

Proceedings Volume 11582, Fourth International Conference on Terahertz and Microwave Radiation: Generation, Detection, and Applications; 1158215 (2020) https://doi.org/10.1117/12.2580599
Event: Fourth International Conference on Terahertz and Microwave Radiation: Generation, Detection, and Applications, 2020, Tomsk, Russian Federation

Abstract

This report will consider the advantages of implementation the ghost imaging method in terahertz range for the far-field imaging and surface plasmon resonance microscopy, as well as an analysis of the factors that affect the resolution of ghost imaging.

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Ildus Sh. Khasanov and Lidia A. Zykova "Terahertz ghost imaging and surface plasmon resonance microscopy: analysis of factors affecting the image quality", Proc. SPIE 11582, Fourth International Conference on Terahertz and Microwave Radiation: Generation, Detection, and Applications, 1158215 (17 November 2020); https://doi.org/10.1117/12.2580599

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