Presentation
5 March 2021 Shaper-based milli-radian accuracy ultrafast pulse spectral phase metrology
Jacob Stamm, Jorge Benel, Esmerando Escoto, Günter Steinmeyer, Marcos Dantus
Author Affiliations +
Abstract
We present a spectral phase measurement and correction method utilizing a pulse shaper. Positive and negative π/2 spectral phase steps are scanned across the spectrum of the pulse while collecting second harmonic spectra. Second and third order phase distortions show characteristic features in the difference between the spectra. Computer simulations show the amplitude and sign of these features quantitatively determine the magnitude and sign of the second and third order dispersion with milliradian accuracy. Experimental dispersion measurements are benchmarked by measuring the group velocity dispersion of air as well as fused silica windows.
Conference Presentation
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Jacob Stamm, Jorge Benel, Esmerando Escoto, Günter Steinmeyer, and Marcos Dantus "Shaper-based milli-radian accuracy ultrafast pulse spectral phase metrology", Proc. SPIE 11676, Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XXI, 116760I (5 March 2021); https://doi.org/10.1117/12.2583037
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KEYWORDS
Dispersion

Metrology

Ultrafast measurement systems

Ultrafast phenomena

Computer simulations

Phase measurement

Silica

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