Review of reliability research on infrared detector

Yang Wang; Chao Meng; Wei Ma

doi:10.1117/12.2585900

12 March 2021 Review of reliability research on infrared detector

Yang Wang, Chao Meng, Wei Ma

Author Affiliations +

Proceedings Volume 11763, Seventh Symposium on Novel Photoelectronic Detection Technology and Applications; 117630R (2021) https://doi.org/10.1117/12.2585900
Event: Seventh Symposium on Novel Photoelectronic Detection Technology and Application 2020, 2020, Kunming, China

Abstract

The development of domestic and foreign reliability research on infrared detector is introduced. Many IDDCA manufacturers have their own reliability assurance systems to obtain high reliability in the developing and manufacturing process. According to the characteristics and workings of infrared detector, the failure mechanism and accelerating test is analyzed. Then the design is optimized constantly, reliability is improved, and the model of reliability is built.

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Yang Wang, Chao Meng, and Wei Ma "Review of reliability research on infrared detector", Proc. SPIE 11763, Seventh Symposium on Novel Photoelectronic Detection Technology and Applications, 117630R (12 March 2021); https://doi.org/10.1117/12.2585900

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