Seismological system fault detection technology based on waveform analysis

Rongdi An; Tao Jing; Yi Sun

doi:10.1117/12.2592519

26 January 2021 Seismological system fault detection technology based on waveform analysis

Rongdi An, Tao Jing, Yi Sun

Proceedings Volume 11767, 2020 International Conference on Optoelectronic Materials and Devices; 117670S (2021) https://doi.org/10.1117/12.2592519
Event: 2020 International Conference on Optoelectronic Materials and Devices, 2020, Guangzhou, China

Abstract

This paper mainly discusses that it is possible to directly determine whether the seismic instrument has a fault during operation based on characteristics of the waveform and that the specific fault of the instrument in such cases can be deduced in reverse according to different waveforms shown by different faults. Faults can be identified early through application of the reverse deduction to instrument maintenance, and maintenance personnel can be prompted to deal with them, thereby ensuring and improving data quality.

Citation Download Citation

Rongdi An, Tao Jing, and Yi Sun "Seismological system fault detection technology based on waveform analysis", Proc. SPIE 11767, 2020 International Conference on Optoelectronic Materials and Devices, 117670S (26 January 2021); https://doi.org/10.1117/12.2592519

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available