Intelligent detection method of DR detection equipment assembly defects based on x-ray digital imaging

Minghui Liu; Fang Zhang; Xiaoyu Liu; Xin Yu; Yang Liu

doi:10.1117/12.2592269

26 January 2021 Intelligent detection method of DR detection equipment assembly defects based on x-ray digital imaging

Minghui Liu, Fang Zhang, Xiaoyu Liu, Xin Yu, Yang Liu

Proceedings Volume 11767, 2020 International Conference on Optoelectronic Materials and Devices; 117671E (2021) https://doi.org/10.1117/12.2592269
Event: 2020 International Conference on Optoelectronic Materials and Devices, 2020, Guangzhou, China

Abstract

X-ray digital imaging (DR) equipment is used for accurate detection, but its own assembly defects will affect the equipment detection results. Therefore, an accurate detection method is needed to detect Dr equipment assembly defects. Because the parameters set by the traditional method can not control the noise interference to the minimum, resulting in poor detection results. Therefore, an intelligent detection method of DR equipment assembly defects based on X-ray digital imaging is proposed. This method obtains the factors affecting the X-ray digital imaging, sets the imaging detection parameters, and detects the DR equipment assembly defects based on the X-ray digital imaging. The experimental results show that compared with the traditional method, the proposed intelligent detection method of defect data detection success rate increased by 11.93%. Visible X-ray digital imaging is more suitable for intelligent defect detection.

Citation Download Citation

Minghui Liu, Fang Zhang, Xiaoyu Liu, Xin Yu, and Yang Liu "Intelligent detection method of DR detection equipment assembly defects based on x-ray digital imaging", Proc. SPIE 11767, 2020 International Conference on Optoelectronic Materials and Devices, 117671E (26 January 2021); https://doi.org/10.1117/12.2592269

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