Deflectometry based on light-field imaging

A. Meguenani; K. Tout; S. Kohler; S. Bazeille; J.-P. Chambard; C. Cudel

doi:10.1117/12.2588988

16 July 2021 Deflectometry based on light-field imaging

A. Meguenani, K. Tout, S. Kohler, S. Bazeille, J.-P. Chambard, C. Cudel

Proceedings Volume 11794, Fifteenth International Conference on Quality Control by Artificial Vision; 1179408 (2021) https://doi.org/10.1117/12.2588988
Event: Fifteenth International Conference on Quality Control by Artificial Vision, 2021, Tokushima, Japan

Abstract

This work presents how deflectometry can be coupled with a light-field camera to better characterize and quantify the depth of anomalies on specular surfaces. In our previous work,1 we proposed a new scanning scheme for the detection and 3D reconstruction of defects on reflective objects. However, the quality of the reconstruction was strongly dependent on the object-camera distance which was required as an external input parameter. In this paper, we propose a new approach that integrates an estimation of this distance into our system by replacing the standard camera with a light-field camera.

Citation Download Citation

A. Meguenani, K. Tout, S. Kohler, S. Bazeille, J.-P. Chambard, and C. Cudel "Deflectometry based on light-field imaging", Proc. SPIE 11794, Fifteenth International Conference on Quality Control by Artificial Vision, 1179408 (16 July 2021); https://doi.org/10.1117/12.2588988

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