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3 August 2021 Retrieving linear and nonlinear optical dispersions of matter: Numerical ellipsometry of silicon and indium tin oxide nanolayers
Michael Scalora, Maria A. Vincenti, Domenico de Ceglia, Neset Akozbek, Laura Rodríguez-Suné, Jose F. Trull, Crina M. Cojocaru
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Proceedings Volume 11796, Active Photonic Platforms XIII; 117960T (2021) https://doi.org/10.1117/12.2594256
Event: SPIE Nanoscience + Engineering, 2021, San Diego, California, United States
Abstract
Methods currently used to determine nonlinear optical constants like n2 or chi3 rely on open and closed z-scan techniques. The study of optics at the nanoscale in the femtosecond regime requires new tools and approaches to extract linear and nonlinear dispersions exhibited by matter. We present a practical approach that amounts to numerical ellipsometry that utilizes experimental harmonic generation conversion efficiencies to retrieve complex, nonlinear dispersion curves. We provide examples of retrieved linear and nonlinear dispersions for a variety of materials, and show that for Silicon the numerical retrieval method yields chi3~10^(-16) (m/V)^2 and chi33w~10^(-17) (m/V)^2 , and visible and near IR ranges. Similarly, we predict chi3~10^(-17) (m/V)^2 and chi33w~10^(-19) (m/V)^2 for ITO as it exhibits linear and nonlinear anisotropic responses due to nonlocal effects.
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Michael Scalora, Maria A. Vincenti, Domenico de Ceglia, Neset Akozbek, Laura Rodríguez-Suné, Jose F. Trull, and Crina M. Cojocaru "Retrieving linear and nonlinear optical dispersions of matter: Numerical ellipsometry of silicon and indium tin oxide nanolayers", Proc. SPIE 11796, Active Photonic Platforms XIII, 117960T (3 August 2021); https://doi.org/10.1117/12.2594256
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KEYWORDS
Ellipsometry
Indium
Oxides
Silicon
Tin
Gold
Harmonic generation
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