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Ptychography has become a popular technique for high-throughput and high-resolution characterization of 2D/3D materials. When objects introduce significantly large phase shifts, a multi-slice model needs to be considered to account for long-distance wave propagation within the sample. Although many groups have demonstrated multi-slice ptychography using specimens that are several times larger than the depth of field (DOF), the benefits of applying the multi-slice ptychography algorithm on small objects within the DOF is rarely discussed. Here we address this question and demonstrate that multi-slice ptychography can play an important role in improving reconstruction quality for continuous objects that are smaller than the DOF.
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Yi Jiang, Junjing Deng, Yudong Yao, Jeffrey A. Klug, Zhonghou Cai, Barry Lai, Stefan Vogt, "Multi-slice ptychography for continuous object within the depth of field," Proc. SPIE 11839, X-Ray Nanoimaging: Instruments and Methods V, 118390E (1 August 2021); https://doi.org/10.1117/12.2594882