Presentation + Paper
9 September 2021 High-energy x-ray phase tomography using grating interferometer with structured anode x-ray source
Kenji Kimura, Mengran Sun, Ryosuke Ueda, Yanlin Wu, Haojie Pan, Atsushi Momose
Author Affiliations +
Abstract
Talbot-Lau interferometers are widely used for X-ray phase imaging/tomography. For thick objects or materials including metals, high-energy X-rays should be used. However, absorption gratings with extremely high aspect-ratios (AR) are necessary but are hard to be fabricated by current microfabrication techniques. As an approach without using high-AR absorption gratings, we developed the high-energy X-ray phase imaging device with a structured anode X-ray source, which has tungsten target array embedded in a diamond substrate. X-rays are emitted from the tungsten region, and therefore G0 can be omitted. We will show the results of high-energy X-ray phase imaging and tomography performed with a design energy of 82 keV.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kenji Kimura, Mengran Sun, Ryosuke Ueda, Yanlin Wu, Haojie Pan, and Atsushi Momose "High-energy x-ray phase tomography using grating interferometer with structured anode x-ray source", Proc. SPIE 11840, Developments in X-Ray Tomography XIII, 118400K (9 September 2021); https://doi.org/10.1117/12.2595488
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KEYWORDS
X-rays

Interferometers

X-ray sources

X-ray imaging

Phase imaging

Scattering

Tomography

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