PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
Terahertz time-domain spectroscopy has been widely applied in performing dielectric analysis for various materials. However, air voids trapped in samples will significantly affect the characterization. In this study, the refractive index of mixture samples consisting of iron trioxide and polytetrafluoroethylene in five different mass ratios were measured with terahertz time-domain spectroscopy. In order to extract the intrinsic refractive index of iron trioxide, the effective medium model of CRI was then applied to remove refractive index of PTFE in the sample. The extracted refractive indices were presented as a variable parameter decrease with the increase of iron trioxide content, which also corresponds to the increase of air voids in the tablets. The correlation between trapped air voids and analyte composition roots from the coarse rust particles used in pellets compression. This study shows that the influence of air porosity should be considered when terahertz waves are utilized to characterize dielectric property of coarse material.
Ying Li,Zhaohui Zhang,Xiaoyan Zhao, andTianyao Zhang
"The influence of sample porosity on refractive index in THz non-destructive testing", Proc. SPIE 11907, Sixteenth National Conference on Laser Technology and Optoelectronics, 119071A (31 August 2021); https://doi.org/10.1117/12.2602928
ACCESS THE FULL ARTICLE
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The alert did not successfully save. Please try again later.
Ying Li, Zhaohui Zhang, Xiaoyan Zhao, Tianyao Zhang, "The influence of sample porosity on refractive index in THz non-destructive testing," Proc. SPIE 11907, Sixteenth National Conference on Laser Technology and Optoelectronics, 119071A (31 August 2021); https://doi.org/10.1117/12.2602928