Paper
15 February 2022 Few-pattern defocusing fringe projection profilometry for high-speed 3-D imaging
Author Affiliations +
Proceedings Volume 12166, Seventh Asia Pacific Conference on Optics Manufacture and 2021 International Forum of Young Scientists on Advanced Optical Manufacturing (APCOM and YSAOM 2021); 121667U (2022) https://doi.org/10.1117/12.2618015
Event: Seventh Asia Pacific Conference on Optics Manufacture and 2021 International Forum of Young Scientists on Advanced Optical Manufacturing (APCOM and YSAOM 2021), 2021, Hong Kong, Hong Kong
Abstract
Fringe projection profilometry (FPP) based on the binary defocusing technique (BD) shows great potential in high-speed 3-D imaging. Due to the constant defocusing degree, existing binary defocusing operations require adopting similar-wavelength fringe patterns, thereby forming a long imaging sequence in multi-frequency temporal phase unwrapping (TPU). In this paper, we propose a few-pattern defocusing FPP for efficient and accurate 3-D imaging. The imaging sequence consists of only 6 hybrid images, namely 2 unit-frequency ramp images, 2 low-frequency, and 2 high-frequency sinusoidal fringe images. Combining unit-frequency ramp and low-frequency fringe images, the unknown average intensity and fringe orders of fringe images can be determined. Consequently, the final absolute phase map can be extracted from the high-frequency fringe images. Moreover, a kernel-optimized dithering technique is presented to generate the projected patterns of hybrid images. In this dithering technique, a dynamic kernel and a dual-objective function ensure the optimal binarization of defocused images with different grayscale variations. Experiment results verify the proposed few-pattern defocusing FPP achieves efficient 3-D imaging with a measurement accuracy of 0.02 mm.
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Chunmei Xu, Yi Jin, Minghui Duan, Yabing Zheng, Zheng Sun, Changan Zhu, and Yan Kan "Few-pattern defocusing fringe projection profilometry for high-speed 3-D imaging", Proc. SPIE 12166, Seventh Asia Pacific Conference on Optics Manufacture and 2021 International Forum of Young Scientists on Advanced Optical Manufacturing (APCOM and YSAOM 2021), 121667U (15 February 2022); https://doi.org/10.1117/12.2618015
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KEYWORDS
Binary data

Fringe analysis

Modulation

3D metrology

Phase shifts

Phase shift keying

3D image processing

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