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The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org. The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon. Please use the following format to cite material from these proceedings: Author(s), “Title of Paper,” in 2021 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology, edited by Guohai Situ, Xun Cao, Xiaopeng Shao, Chao Zuo, Wolfgang Osten, Proc. of SPIE 12281, Seven-digit Article CID Number (DD/MM/YYYY); (DOI URL). ISSN: 0277-786X ISSN: 1996-756X (electronic) ISBN: 9781510655676 ISBN: 9781510655683 (electronic) Published by SPIE P.O. Box 10, Bellingham, Washington 98227-0010 USA Telephone +1 360 676 3290 (Pacific Time) Copyright © 2022 Society of Photo-Optical Instrumentation Engineers (SPIE). Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of fees. To obtain permission to use and share articles in this volume, visit Copyright Clearance Center at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. Printed in the United States of America by Curran Associates, Inc., under license from SPIE. Publication of record for individual papers is online in the SPIE Digital Library. Paper Numbering: A unique citation identifier (CID) number is assigned to each article in the Proceedings of SPIE at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:
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Session Chairs IntroductionThis volume contains the papers presented during the 2021 International Conference on Optical Instrument and Technology at the topical meeting of Optoelectronic Imaging/Spectroscopy and Signal Processing Technology. The focus of this meeting is especially directed to the advance in this field and related areas. Owing to the COVID-19 pandemic, this meeting has been postponed for about half a year and was held in an online mode. But we still received 22 submissions from scientists and engineers from China. The strong limitation of the number of papers which can be presented orally and discussed effectively during meeting without holding parallel sessions was an important orientation. The classification of all the accepted papers into the two topical sessions listed above was also very difficult and it often requires compromises. We hope that our decision will be accepted by the audience. The editors would like to express thanks to the international program committee for helping us to find a good solution to finalize the meeting. We would also like to thank all the authors who spent a lot of time and effort in the preparation of their papers. Our appreciation would also go to Prof. Liquan Dong and Mrs. Cuiling Li, and all the local staff from Beijing Institute of Technology. Without their help, it was not possible to make the meeting so successful. Guohai Situ Xun Cao Xiaopeng Shao Chao Zuo Wolfgang Osten OrganizersOpto-Electronic Mechanic Technology and System Integration Chapter, CIS (China) Committee on Optoelectronic Technology, COS (China) Committee on Optics, China Ordnance Society (China) Optical Instrument Chapter, CIS (China) Beijing Institute of Technology (China) Tianjin University (China) Tsinghua University (China) Peking University (China) Nanjing University (China) Zhejiang University (China) Sichuan University (China) Nankai University (China) Capital Normal University (China) Beijing University of Posts and Telecommunications (China) Beihang University (China) Chongqing University (China) University of Shanghai for Science and Technology (China) Instrument Society of America (United States) Institute of Measurement and Control (United Kingdom) Hong Kong Institution of Engineers (Hong Kong, China) The Society of Measurement and Control (Japan) |