Open Access Paper
8 July 2022 Front Matter: Volume 12281
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 12281, including the Title Page, Copyright information, Table of Contents, and Conference Committee listings.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in 2021 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology, edited by Guohai Situ, Xun Cao, Xiaopeng Shao, Chao Zuo, Wolfgang Osten, Proc. of SPIE 12281, Seven-digit Article CID Number (DD/MM/YYYY); (DOI URL).

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510655676

ISBN: 9781510655683 (electronic)

Published by

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Copyright © 2022 Society of Photo-Optical Instrumentation Engineers (SPIE).

Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of fees. To obtain permission to use and share articles in this volume, visit Copyright Clearance Center at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher.

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Paper Numbering: A unique citation identifier (CID) number is assigned to each article in the Proceedings of SPIE at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:

  • The first five digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Symposium Committee

Symposium Chairs

  • Zheng You, CIS (China), Tsinghua University (China)

  • David Andrews, University of East Anglia (United Kingdom)

Symposium Co-chairs

  • Tianchu Li, National Institute of Metrology, China (China)

  • Songlin Zhuang, University of Shanghai for Science and Technology (China)

  • Liwei Zhou, Beijing Institute of Technology (China)

  • Shenghua Ye, Tianjin University (China)

  • Yimo Zhang, Tianjin University (China)

  • Guangjun Zhang, Southeast University (China)

  • Min Gu, University of Shanghai for Science and Technology (China)

  • Xiangang Luo, Institute of Optics and Electronics, CAS (China)

  • Jianjun Deng, China Academy of Engineering Physics (China)

  • Fengyi Jiang, Nanchang University (China)

Technical Program Chairs

  • Guofan Jin, Tsinghua University (China)

  • Tianchu Li, National Institute of Metrology (China)

Technical Program Co-chairs

  • Jinxue Wang, SPIE

  • Tiegen Liu, Tianjin University (China)

Local Organizing Committee Chairs

  • Youhua Wu, China Instrument and Control Society (China)

  • Tong Zhang, China Instrument and Control Society (China)

Local Organizing Committee Co-chairs

  • Qun Hao, Beijing Institute of Technology (China)

  • Guoqiang Ni, Beijing Institute of Technology (China)

General Secretaries

  • Tong Zhang, China Instrument and Control Society (China)

  • Li Zhang, China Instrument and Control Society (China)

Vice General Secretaries

  • Liquan Dong, Beijing Institute of Technology (China)

  • Yuejin Zhao, Beijing Institute of Technology (China)

  • Qican Zhang, Sichuan University (China)

  • Yu-nan Sun, Beijing Institute of Technology (China)

Local Organizing Committee

  • Xuping Zhang, Nanjing University (China)

  • Shangzhong Jin, China Jiliang University (China)

  • Liangcai Cao, Tsinghua University (China)

  • Yongtian Wang, Beijing Institute of Technology (China)

  • Chunqing Gao, Beijing Institute of Technology (China)

  • Jian Chen, Nanjing University of Posts and Telecommunications (China)

  • Shilong Pan, Nanjing University of Aeronautics and Astronautics (China)

  • Guohai Situ, Shanghai Institute of Optics and Fine Mechanics, CAS (China)

  • Jigui Zhu, Tianjin University (China)

  • Baojun Li, Jinan University (China)

  • Cunlin Zhang, Capital Normal University (China)

  • Zeren Li, Shenzhen Technology University (China)

  • Libo Yuan, Guilin University of Electronic Technology (China)

  • Yongcai Guo, Chongqing University (China)

  • Tian Lan, Beijing Institute of Technology (China)

  • Cuiling Li, Beijing Institute of Technology (China)

Conference Committee

Conference Chairs

  • Guohai Situ, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences (China)

  • Xun Cao, Nanjing University (China)

  • Xiaopeng Shao, Xidian University (China)

  • Chao Zuo, Nanjing University of Science and Technology (China)

  • Wolfgang Osten, Institut für Technische Optik, Universität Stuttgart (Germany)

Conference Review Committee

  • George Barbastathis, Massachusetts Institute of Technology (United States)

  • David J. Brady, Wyant College of Optical Sciences (United States)

  • Qionghai Dai, Tsinghua University (China)

  • Byoungho Lee, Seoul National University (Korea, Republic of)

  • Cheng Liu, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences (China)

  • Takanori Nomura, Wakayama University (Japan)

  • John T. Sheridan, University College Dublin (Ireland)

  • Guangming Shi, Xidian University (China)

  • Lei Tian, Boston University (United States)

  • Feng Wu, University of Science and Technology of China (China)

  • Ping Yu, University of Missouri (United States)

  • Jingyi Yu, ShanghaiTech University (China)

  • Jianlin Zhao, Northwestern Polytechnical University (China)

Session Chairs

  • 1 Imaging and Image Processing I

    Guohai Situ, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences (China)

  • 2 Imaging and Image Processing II

    Xiaopeng Shao, Xidian University (China)

Introduction

This volume contains the papers presented during the 2021 International Conference on Optical Instrument and Technology at the topical meeting of Optoelectronic Imaging/Spectroscopy and Signal Processing Technology. The focus of this meeting is especially directed to the advance in this field and related areas. Owing to the COVID-19 pandemic, this meeting has been postponed for about half a year and was held in an online mode. But we still received 22 submissions from scientists and engineers from China. The strong limitation of the number of papers which can be presented orally and discussed effectively during meeting without holding parallel sessions was an important orientation. The classification of all the accepted papers into the two topical sessions listed above was also very difficult and it often requires compromises. We hope that our decision will be accepted by the audience.

The editors would like to express thanks to the international program committee for helping us to find a good solution to finalize the meeting. We would also like to thank all the authors who spent a lot of time and effort in the preparation of their papers. Our appreciation would also go to Prof. Liquan Dong and Mrs. Cuiling Li, and all the local staff from Beijing Institute of Technology. Without their help, it was not possible to make the meeting so successful.

Guohai Situ

Xun Cao

Xiaopeng Shao

Chao Zuo

Wolfgang Osten

Organizers

Opto-Electronic Mechanic Technology and System Integration Chapter, CIS (China)

Committee on Optoelectronic Technology, COS (China)

Committee on Optics, China Ordnance Society (China)

Optical Instrument Chapter, CIS (China)

Beijing Institute of Technology (China)

Tianjin University (China)

Tsinghua University (China)

Peking University (China)

Nanjing University (China)

Zhejiang University (China)

Sichuan University (China)

Nankai University (China)

Capital Normal University (China)

Beijing University of Posts and Telecommunications (China)

Beihang University (China)

Chongqing University (China)

University of Shanghai for Science and Technology (China)

Instrument Society of America (United States)

Institute of Measurement and Control (United Kingdom)

Hong Kong Institution of Engineers (Hong Kong, China)

The Society of Measurement and Control (Japan)

© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 12281", Proc. SPIE 12281, 2021 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology, 1228101 (8 July 2022); https://doi.org/10.1117/12.2641651
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KEYWORDS
Adaptive optics

Channel projecting optics

Image enhancement

Lithium

Optoelectronics

X-ray optics

Image quality

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