Refraction-contrast CT measurement system based on x-ray dark field imaging for μm-order scale imaging of breast tissue specimens

N. Sunaguchi; Z. Huang; K. Taniguchi; D. Shimao; T. Yuasa; R. Nishimura; A. Iwakoshi; M. Ando; S. Ichihara

doi:10.1117/12.2624056

13 July 2022 Refraction-contrast CT measurement system based on x-ray dark field imaging for μm-order scale imaging of breast tissue specimens

N. Sunaguchi, Z. Huang, K. Taniguchi, D. Shimao, T. Yuasa, R. Nishimura, A. Iwakoshi, M. Ando, S. Ichihara

Author Affiliations +

Proceedings Volume 12286, 16th International Workshop on Breast Imaging (IWBI2022); 122860D (2022) https://doi.org/10.1117/12.2624056
Event: Sixteenth International Workshop on Breast Imaging, 2022, Leuven, Belgium

Abstract

The importance of the three-dimensional (3D) pathological observation of biological soft tissues has increased in recent year, and various visualization tools to obtain 3D information easily and analysis methods focusing on the 3D micro structures have been developed. Refraction-contrast computed tomography based on x-ray dark-field imaging technique (XDFI) is one of the powerful methods with a high contrast and spatial resolution. In this study, in order to apply XDFI as new pathology tool, we will develop the x-ray optics and the x-ray camera, which are important components of the XDFI imaging system, to achieve a spatial resolution of 5 μm and evaluate the spatial resolution by experiments of the x-ray micro chart and the breast tissue specimen.

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N. Sunaguchi, Z. Huang, K. Taniguchi, D. Shimao, T. Yuasa, R. Nishimura, A. Iwakoshi, M. Ando, and S. Ichihara "Refraction-contrast CT measurement system based on x-ray dark field imaging for μm-order scale imaging of breast tissue specimens", Proc. SPIE 12286, 16th International Workshop on Breast Imaging (IWBI2022), 122860D (13 July 2022); https://doi.org/10.1117/12.2624056

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