Advanced diagnostic detectors for rogue phenomena, single-shot applications

M. Caselle; S. Bielawski; S. Chilingaryan; M. K. Czwalinna; T. Dritschler; A. Kopmann; E. Kunakovskaya; O. Manzhura; S. Funkner; G. Niehues; M. M. Patil; E. Roussel; A. Santamaria Garcia; L. Scomparin; B. Steffen; J. L. Steinmann; C. Szwaj; E. Bründermann; A.-S. Müller; A. C. Ulusoy; M. Weber; S. Frank

doi:10.1117/12.2657489

14 March 2023 Advanced diagnostic detectors for rogue phenomena, single-shot applications

M. Caselle, S. Bielawski, S. Chilingaryan, M. K. Czwalinna, T. Dritschler, A. Kopmann, E. Kunakovskaya, O. Manzhura, S. Funkner, G. Niehues, M. M. Patil, E. Roussel, A. Santamaria Garcia, L. Scomparin, B. Steffen, J. L. Steinmann, C. Szwaj, E. Bründermann, A.-S. Müller, A. C. Ulusoy, M. Weber, S. Frank

Author Affiliations +

Proceedings Volume 12406, Real-time Measurements, Rogue Phenomena, and Single-Shot Applications VIII; 1240605 (2023) https://doi.org/10.1117/12.2657489
Event: SPIE LASE, 2023, San Francisco, California, United States

Abstract

The detection of rapid dynamics in diverse physical systems is traditionally very difficult and strongly dominated by several noise contributions. Laser mode-locking, electron bunches in accelerators, and optical-triggered phases in materials are events that carry important information about the system from which they emerge. By detecting single-shot spectra with high repetition rates over long-time scales, new possibilities and applications to diagnose, control and tailor the spectral dynamics of lasers and electron beams in synchrotron and free-electron laser (FEL) accelerators open up. This contribution focuses on the latest developments of real-time, single-shot, high-repetition-rate detectors and data acquisition systems, with a special focus on emerging technologies and new possibilities in the diagnostics of rogue optical signals.

Conference Presentation

Citation Download Citation

M. Caselle, S. Bielawski, S. Chilingaryan, M. K. Czwalinna, T. Dritschler, A. Kopmann, E. Kunakovskaya, O. Manzhura, S. Funkner, G. Niehues, M. M. Patil, E. Roussel, A. Santamaria Garcia, L. Scomparin, B. Steffen, J. L. Steinmann, C. Szwaj, E. Bründermann, A.-S. Müller, A. C. Ulusoy, M. Weber, and S. Frank "Advanced diagnostic detectors for rogue phenomena, single-shot applications", Proc. SPIE 12406, Real-time Measurements, Rogue Phenomena, and Single-Shot Applications VIII, 1240605 (14 March 2023); https://doi.org/10.1117/12.2657489

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