Phase retrieval by pattern classification and circular mean for robust optical testing

Ohgan Kim; Yun-woo Lee; Ho-Soon Yang

doi:10.1117/12.2677804

4 October 2023 Phase retrieval by pattern classification and circular mean for robust optical testing

Ohgan Kim, Yun-woo Lee, Ho-Soon Yang

Proceedings Volume 12677, Astronomical Optics: Design, Manufacture, and Test of Space and Ground Systems IV; 1267707 (2023) https://doi.org/10.1117/12.2677804
Event: SPIE Optical Engineering + Applications, 2023, San Diego, California, United States

Abstract

For accurate optical testing of large mirrors with long radii of curvature, multiple measurements using single-shot phaseshifting interferometers are typically required to reduce the impact of air turbulence on air stratification prevention. This paper proposes a new technique that utilizes hierarchical clustering to classify acquired wrapped phases into similar pattern clusters, eliminating the influence of unknown noises by excluding minority patterns. For each cluster, the circular mean is used to calculate denoised wrapped phases, and the surface figure is obtained from the unwrapped phases. Since the number of phase-unwrapping algorithm runs equals the number of chosen clusters, the proposed technique is significantly faster than conventional procedures. In 500 measurements on a 1.5 m diameter spherical mirror, the proposed technique reduced measurement time and the root-mean-square error's standard deviation of the surface figure by approximately 23% and 15%, respectively, compared to conventional procedures.

Conference Presentation

(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Ohgan Kim, Yun-woo Lee, and Ho-Soon Yang "Phase retrieval by pattern classification and circular mean for robust optical testing", Proc. SPIE 12677, Astronomical Optics: Design, Manufacture, and Test of Space and Ground Systems IV, 1267707 (4 October 2023); https://doi.org/10.1117/12.2677804

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