Upcoming soft x-ray nanoprobe beamline at NSLS-II

Wen Hu; Joseph Dvorak; Oleg Chubar; An He; Lukas Lienhard; Daniel M. Bacescu; Evgeny Nazaretski; Steven Hulbert; Andrew L. Walter

doi:10.1117/12.2677136

5 October 2023 Upcoming soft x-ray nanoprobe beamline at NSLS-II

Wen Hu, Joseph Dvorak, Oleg Chubar, An He, Lukas Lienhard, Daniel M. Bacescu, Evgeny Nazaretski, Steven Hulbert, Andrew L. Walter

Author Affiliations +

Proceedings Volume 12698, X-Ray Nanoimaging: Instruments and Methods VI; 1269809 (2023) https://doi.org/10.1117/12.2677136
Event: SPIE Optical Engineering + Applications, 2023, San Diego, California, United States

Abstract

The Soft X-ray Nanoprobe (SXN) beamline, in development at Synchrotron NSLS-II under NEXT-II U.S. Department of Energy MIE project, is dedicated to soft x-ray scanning microscopy. It will offer researchers state-of-the-art soft x-ray nano-imaging and spectroscopy tools with world-leading coherent high photon flux in the energy range from 250 eV to 2500 eV and full polarization control with an aim to reach spatial resolution below 10 nm. It will provide element access from carbon (C) to sulfur (S) through K-edges and many other important elements through L- and M-edges. The primary endstation, nanoISM, will offer both a conventional Scanning Transmission X-ray Microscopy (STXM) mode, for high throughput 2D/3D absorption imaging, and a coherent diffractive imaging (ptychography) mode, for extra high spatial resolution. This article presents the design and status of the SXN beamline. The result of wave-optics- simulation allowed us to verify the beam performance from “source to sample” and supports the design of the beamline.

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Wen Hu, Joseph Dvorak, Oleg Chubar, An He, Lukas Lienhard, Daniel M. Bacescu, Evgeny Nazaretski, Steven Hulbert, and Andrew L. Walter "Upcoming soft x-ray nanoprobe beamline at NSLS-II", Proc. SPIE 12698, X-Ray Nanoimaging: Instruments and Methods VI, 1269809 (5 October 2023); https://doi.org/10.1117/12.2677136

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