PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
Estimation of error bars on laser damage threshold measurements using only the fluence inaccuracy of the test laser unfortunately does not cover the full range of systematic errors in the laser damage protocol. A poor understanding of the actual measurement errors can lead to inaccurate conclusions or inadequate safety factors when designing laser systems. This Monte Carlo analysis focuses on improving the understanding of typical systematic errors of the ISO and raster scanning laser damage test protocols through modeling of the impact of fluence variations, laser beam pointing, and laser beam shape. The impact of increased test area and the magnitude of fluence increments between testing sites is also explored in an attempt to reduce systematic errors. Raster scanning tends to have significantly lower systematic errors than the ISO test. However, the raster scan protocol cannot measure unconditioned laser damage thresholds and has microscopy resolution limitations for pre and post irradiation inspection.
Conference Presentation
(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Christopher J. Stolz
"Monte Carlo analysis of ISO and raster scan laser damage protocols: part 2", Proc. SPIE 12726, Laser-Induced Damage in Optical Materials 2023, 127260F (24 November 2023); https://doi.org/10.1117/12.2684458
ACCESS THE FULL ARTICLE
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The alert did not successfully save. Please try again later.
Christopher J. Stolz, "Monte Carlo analysis of ISO and raster scan laser damage protocols: part 2," Proc. SPIE 12726, Laser-Induced Damage in Optical Materials 2023, 127260F (24 November 2023); https://doi.org/10.1117/12.2684458