Paper
1 August 2023 Design of inductance parameter measurement instrument based on steady-state circuit sinusoidal analysis of phasors
Lijuan Cao, Yuncong Long, Yangjing Zhou
Author Affiliations +
Proceedings Volume 12752, Second International Conference on Optoelectronic Information and Computer Engineering (OICE 2023); 1275209 (2023) https://doi.org/10.1117/12.2691219
Event: Second International Conference on Optoelectronic Information and Computer Engineering (OICE 2023), 2023, Hangzhou, China
Abstract
The inductance measurement scheme designed in this paper adopts a steady-state RL series circuit with sinusoidal current and voltage signals, and utilizes phasor analysis to convert the measurement of inductance into corresponding voltage values. The converted signal is sent to the MCU CPU for data calculation and processing after AD conversion, and the measurement results are directly displayed in digital form on the LCD. This paper provides a detailed introduction to the measurement principle and hardware-software design of this measurement scheme. From simulation test data, it can be found that the measurement range of the inductance measurement circuit is 5mH~990mH, and the accuracy is relatively high. The overall structure of the measurement circuit is simple, and the peripheral components have low precision requirements, which is easy to implement and can be extended to capacitance measurement.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lijuan Cao, Yuncong Long, and Yangjing Zhou "Design of inductance parameter measurement instrument based on steady-state circuit sinusoidal analysis of phasors", Proc. SPIE 12752, Second International Conference on Optoelectronic Information and Computer Engineering (OICE 2023), 1275209 (1 August 2023); https://doi.org/10.1117/12.2691219
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KEYWORDS
Inductance

Resistance

Data conversion

Microcontrollers

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