Planar crystal array spectrometer for simultaneous spectrum and integrated time spectrum measurement of pulse characteristic x-ray

Ge Ma; Dongwei Hei; Jun Chen; Bo Tang; Jingtao Xia; Fuli Wei; Jianhui Luo; Rui Yan

doi:10.1117/12.2690275

17 August 2023 Planar crystal array spectrometer for simultaneous spectrum and integrated time spectrum measurement of pulse characteristic x-ray

Ge Ma, Dongwei Hei, Jun Chen, Bo Tang, Jingtao Xia, Fuli Wei, Jianhui Luo, Rui Yan

Author Affiliations +

Proceedings Volume 12757, 3rd International Conference on Laser, Optics, and Optoelectronic Technology (LOPET 2023); 127570F (2023) https://doi.org/10.1117/12.2690275
Event: 3rd International Conference on Laser, Optics and Optoelectronic Technology (LOPET 2023), 2023, Kunming, China

Abstract

A new focusing crystal spectrometer based on a planar crystal array was developed for simultaneous diagnostics of the X-ray diffraction spectrum and integrated time spectrum. In the crystal array, flat crystals were distributed in a circular shape. A coaxial annular optical fiber array was arranged perpendicular to the dispersion direction and each ring collected X-ray diffraction with different energy. The ray tracing method was used to analyze the spatial distribution of diffraction. A prototype was built and the process of X-ray pulse and the relative intensities of the characteristic X-rays Cu-Kα and CuKβ were measured. The result showed that the X-ray pulse lasted about 80ns, with a rising time of 30ns. There was a plateau period of 10ns during the falling time. The intensity ratio of Cu-Kα and Cu-Kβ experienced a process of rapid descent stabilization and slow ascent, the ratio was stabilized at around 1.5 nearby the Emission intensity peak.

Citation Download Citation

Ge Ma, Dongwei Hei, Jun Chen, Bo Tang, Jingtao Xia, Fuli Wei, Jianhui Luo, and Rui Yan "Planar crystal array spectrometer for simultaneous spectrum and integrated time spectrum measurement of pulse characteristic x-ray", Proc. SPIE 12757, 3rd International Conference on Laser, Optics, and Optoelectronic Technology (LOPET 2023), 127570F (17 August 2023); https://doi.org/10.1117/12.2690275

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
9 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Diffraction

Crystals

X-rays

Spectroscopy

X-ray diffraction

Prototyping

Design and modelling

Show All Keywords

Keywords/Phrases

Search In:

Publication Years